{"id":109,"date":"2025-07-25T11:25:18","date_gmt":"2025-07-25T02:25:18","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/wp\/?page_id=109"},"modified":"2025-08-24T19:20:34","modified_gmt":"2025-08-24T10:20:34","slug":"high_current","status":"publish","type":"page","link":"https:\/\/www.seiken.co.jp\/english\/products\/probe\/high_current\/","title":{"rendered":"High-Current Technology"},"content":{"rendered":"<section id=\"about\" class=\"container\">\n<h2>Enhanced with CNT Plating for better Performance<\/h2>\n<div class=\"column2 -img2\">\n<div class=\"txt_wrap\">\n<p>\n            Traditional contact probes have long relied on surface treatments such as gold (Au) or rhodium (Rh) plating.<br \/>\n            While effective for standard applications, these materials can fall short in modern testing<br \/>\n            environments\u2014especially when dealing with lead-free solder, aluminum electrodes, or high-current<br \/>\n            measurements.<br \/>\n            <br \/>At Seiken, we\u2019ve addressed this challenge by leveraging the unique properties of Carbon Nanotubes<br \/>\n            (CNTs). By incorporating CNTs into gold plating, we\u2019ve developed a new high-current probe that delivers<br \/>\n            exceptionally low contact resistance and better durability. This technology, was presented at TestConX 2025,<br \/>\n            and was even awarded in the poster session for its innovation.\n          <\/p>\n<\/p><\/div>\n<div class=\"img_wrap column2\">\n<figure>\n            <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/high_current\/about_img01.jpg\" alt=\"High-Current Technology\"><br \/>\n          <\/figure>\n<figure>\n            <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/high_current\/about_img02.jpg\" alt=\"High-Current Technology\"><br \/>\n          <\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<\/section>\n<div class=\"anchor\">\n<ul class=\"anchor_list container\">\n<li><a href=\"#feature\">Key Features &#038; Advantages<\/a><\/li>\n<li><a href=\"#usage\">Application Examples<\/a><\/li>\n<li><a href=\"#cases\">Custom solution examples<\/a><\/li>\n<li><a href=\"#related_products\">Related Products<\/a><\/li>\n<\/ul><\/div>\n<section id=\"feature\" class=\"container\">\n<h2>Key Features &#038; Advantages<\/h2>\n<div class=\"box -border\">\n<h3>01 Optimized contact resistance<\/h3>\n<p>Our CNT-treated probes maintain stable contact resistance even during continuous high-current conduction.<br \/>\n          Compared to untreated probes, this minimizes the risk of failure caused by heat and electrical stress,<br \/>\n          providing reliable performance throughout extended use.<\/p>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>02 Extended probe lifespan<\/h3>\n<p>Repeated high-current contact often leads to wear and damage in conventional probes. CNT treatment increases<br \/>\n          durability, reducing degradation and failure over time\u2014even under demanding conditions.<\/p>\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/high_current\/feature_img01.jpg\" alt=\"Durability Test against Aluminum(20A, 200ms)\"><\/div>\n<\/figure><\/div>\n<div class=\"box -border\">\n<h3>03 Reliable contact with aluminum electrodes<\/h3>\n<p>CNT coatings outperform conventional palladium alloy or gold plating when making contact with aluminum<br \/>\n          electrodes, providing more consistent and stable electrical connections.<\/p>\n<\/p><\/div>\n<\/section>\n<section id=\"usage\" class=\"container\">\n<div class=\"ttl_link\">\n<h2>Application Examples<\/h2>\n<p>        <a href=\"..\/..\/industry_category\/\" class=\"link\"><span>Explore more <\/span><\/a>\n      <\/div>\n<div class=\"column2\">\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/high_current\/usage_img01.jpg\" alt=\"\"><\/div>\n<\/figure>\n<div class=\"txt_wrap\">\n<ul class=\"list -dotted\">\n<li>Power device testing: A wide range, from front-end to back-end devices.<\/li>\n<\/ul><\/div>\n<\/p><\/div>\n<\/section>\n","protected":false},"excerpt":{"rendered":"<p>Enhanced with CNT Plating for better Performance Traditional contact probes have long relied on surface treatm [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":39,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-products-child.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-109","page","type-page","status-publish","hentry"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/109","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/comments?post=109"}],"version-history":[{"count":0,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/109\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/39"}],"wp:attachment":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/media?parent=109"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}