{"id":111,"date":"2025-07-25T11:30:42","date_gmt":"2025-07-25T02:30:42","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/wp\/?page_id=111"},"modified":"2025-08-24T19:21:04","modified_gmt":"2025-08-24T10:21:04","slug":"high_frequency","status":"publish","type":"page","link":"https:\/\/www.seiken.co.jp\/english\/products\/probe\/high_frequency\/","title":{"rendered":"High-Frequency Technology"},"content":{"rendered":"<section id=\"about\" class=\"container\">\n<h2>Precision Testing Solutions with Low Inductance<\/h2>\n<div class=\"column2 -img2\">\n<div class=\"txt_wrap\">\n<p>\n              In high-frequency testing, minimizing inductance is the key to achieving accurate and reliable measurements. The shorter the probe, the lower the inductance. To meet these strict requirements, we have developed a compact double-ended probe with a total length of just 1.2mm\u2014made possible through advanced microfabrication and assembly techniques. Despite its extremely small size, this probe maintains the same structure and usability as standard double-ended probes.<br \/>And with support for fine-pitch spacing down to 0.3mm, it\u2019s an ideal solution for inspecting today&#8217;s ever-smaller electronic components.\n            <\/p>\n<\/p><\/div>\n<div class=\"img_wrap column2\">\n<figure>\n              <img decoding=\"async\" class=\"-p25_sp\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/high_frequency\/about_img01.jpg\" alt=\"High-Frequency Technology\"><br \/>\n            <\/figure>\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/high_frequency\/about_img02.jpg\" alt=\"\"><figcaption>Size Comparison: Probe vs. Grain of Rice<\/figcaption><\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<\/section>\n<div class=\"anchor\">\n<ul class=\"anchor_list container\">\n<li><a href=\"#feature\">Key Features &#038; Advantages<\/a><\/li>\n<li><a href=\"#usage\">Application Examples<\/a><\/li>\n<li><a href=\"#cases\">Custom solution examples<\/a><\/li>\n<li><a href=\"#related_products\">Related Products<\/a><\/li>\n<\/ul><\/div>\n<section id=\"feature\" class=\"container\">\n<h2>Key Features &#038; Advantages<\/h2>\n<div class=\"box -border\">\n<h3>01 Low inductance for high-frequency accuracy<\/h3>\n<p>By utilizing precision-cut miniature components and assembling them into a compact 1.2mm form factor, we\u2019ve achieved excellent low-inductance characteristics\u2014essential for high-frequency test environments.<\/p>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>02 Reliable contact with customizable tip shapes and alloys<\/h3>\n<p>Choose from a variety of tip shapes\u2014including needle, crown, and rounded types\u2014tailored to suit your specific test targets. We also offer contact alloys specially selected for optimal performance with soldered surfaces, ensuring stable and repeatable electrical connections.<\/p>\n<\/p><\/div>\n<\/section>\n<section id=\"usage\" class=\"container\">\n<div class=\"ttl_link\">\n<h2>Application Examples<\/h2>\n<p>          <a href=\"..\/..\/industry_category\/\" class=\"link\"><span>Explore more<\/span><\/a>\n        <\/div>\n<div class=\"column2\">\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/high_frequency\/usage_img01.jpg\" alt=\"\"><\/div>\n<\/figure>\n<div class=\"txt_wrap\">\n<ul class=\"list -dotted\">\n<li>High-Frequency Device Testing<\/li>\n<\/ul><\/div>\n<\/p><\/div>\n<\/section>\n","protected":false},"excerpt":{"rendered":"<p>Precision Testing Solutions with Low Inductance In high-frequency testing, minimizing inductance is the key to [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":39,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-products-child.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-111","page","type-page","status-publish","hentry"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/111","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/comments?post=111"}],"version-history":[{"count":0,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/111\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/39"}],"wp:attachment":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/media?parent=111"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}