{"id":123,"date":"2025-07-25T11:50:42","date_gmt":"2025-07-25T02:50:42","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/wp\/?page_id=123"},"modified":"2025-08-24T18:39:58","modified_gmt":"2025-08-24T09:39:58","slug":"fine_pitch","status":"publish","type":"page","link":"https:\/\/www.seiken.co.jp\/english\/products\/probe_cards\/fine_pitch\/","title":{"rendered":"Fine-Pitch Probe Card"},"content":{"rendered":"<section id=\"about\" class=\"container\">\n<h2>Breaking Trough the Limits of Fine-Pitch Testing<\/h2>\n<div class=\"column2 -img2\">\n<div class=\"txt_wrap\">\n<p>\n              As technology advances, the gap between front-end and back-end testing methods has closed. While cantilever probes were traditionally used for front-end testing, and contact probes for back-end testing, emerging devices like WL-CSP, Flip Chip, and Copper Pillar require more advanced solutions that cantilever probes alone cannot provide.<br \/>\n              <br \/>Seiken has redefined the standards of fine-pitch testing with our innovative contact probe card, capable of handling pitches as small as 130\u03bcm\u2014going beyond the conventional advanced-type cards, which typically support pitches of 100\u03bcm or more.\n            <\/p>\n<div class=\"btn_wrap -pc\">\n              <a href=\"..\/..\/probe\/fine_pitch\/\" class=\"btn\">Learn More About Fine-Pitch Technology<\/a>\n            <\/div>\n<\/p><\/div>\n<figure>\n            <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe_cards\/fine_pitch\/about_img01.jpg\" alt=\"Fine-Pitch Probe Card\"><br \/>\n          <\/figure>\n<\/p><\/div>\n<div class=\"btn_wrap -sp\">\n          <a href=\"..\/..\/probe\/fine_pitch\/\" class=\"btn\">Learn More About Fine-Pitch Technology<\/a>\n        <\/div>\n<\/section>\n<div class=\"anchor\">\n<ul class=\"anchor_list container\">\n<li><a href=\"#feature\">Key Features &#038; Advantages<\/a><\/li>\n<li><a href=\"#usage\">Application Examples<\/a><\/li>\n<li><a href=\"#cases\">Custom solution examples<\/a><\/li>\n<li><a href=\"#related_products\">Related Products<\/a><\/li>\n<\/ul><\/div>\n<section id=\"feature\" class=\"container\">\n<h2>Key Features &#038; Advantages<\/h2>\n<div class=\"box -border\">\n<h3>01 Flexible grid layout<\/h3>\n<div class=\"column2\">\n<div class=\"txt_wrap\">\n<p>Our solution easily accommodates grid layouts and multi-contact designs, offering a level of versatility that traditional cantilever probes cannot match. Maintenance is also simplified, with easy probe replacements that improve efficiency and reduce downtime.<\/p>\n<\/p><\/div>\n<figure><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe_cards\/fine_pitch\/feature_img01.jpg\" alt=\"Fine-Pitch Probe Card\"><figcaption>Pin Layout with 130\u03bcm Pitch<\/figcaption><\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>02 Ready for volume production<\/h3>\n<p>Whether you&#8217;re working with a single unit for prototyping or need larger-scale production, Seiken provides consistent quality, ensuring your testing needs are met at every stage.<\/p>\n<\/p><\/div>\n<\/section>\n<section id=\"usage\" class=\"container\">\n<div class=\"ttl_link\">\n<h2>Application Examples<\/h2>\n<p>          <a href=\"..\/..\/industry_category\/\" class=\"link\"><span>Explore more <\/span><\/a>\n        <\/div>\n<div class=\"column2\">\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe_cards\/fine_pitch\/usage_img01.jpg\" alt=\"\"><\/div>\n<\/figure>\n<div class=\"txt_wrap\">\n<ul class=\"list -dotted\">\n<li>WL-CSP<\/li>\n<li>FlipChip<\/li>\n<li>Copper Pillar<\/li>\n<\/ul><\/div>\n<\/p><\/div>\n<\/section>\n","protected":false},"excerpt":{"rendered":"<p>Breaking Trough the Limits of Fine-Pitch Testing As technology advances, the gap between front-end and back-en [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":42,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-products-child.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-123","page","type-page","status-publish","hentry"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/123","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/comments?post=123"}],"version-history":[{"count":0,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/123\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/42"}],"wp:attachment":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/media?parent=123"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}