{"id":125,"date":"2025-07-25T11:53:09","date_gmt":"2025-07-25T02:53:09","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/wp\/?page_id=125"},"modified":"2025-08-24T18:41:15","modified_gmt":"2025-08-24T09:41:15","slug":"high_current","status":"publish","type":"page","link":"https:\/\/www.seiken.co.jp\/english\/products\/probe_cards\/high_current\/","title":{"rendered":"High-Current Probe Card"},"content":{"rendered":"<section id=\"about\" class=\"container\">\n<h2>Pushing the Limits of High-Current Testing<\/h2>\n<div class=\"column2 -img2\">\n<div class=\"txt_wrap\">\n<p>As automotive technologies such as IGBTs advance, the need for high-current testing\u2014handling several hundred amps through emitter electrodes\u2014is growing rapidly. Traditional probe cards often struggle under these extreme conditions, even when load distribution is optimized across multiple pins.<\/p>\n<p>Seiken\u2019s high-current probe card overcomes these barriers by incorporating  CNT (Carbon Nanotube) technology at the probe tips, dramatically increasing the allowable current capacity. In addition, the card\u2019s main bodis built with a robust metal structure that allows current to flow through the housing as well, minimizing the load on each individual pin. This innovative design enables far more stable and reliable high-current measurements. If you are facing challenges in high-current testing, we invite you to consult with us.<\/p>\n<\/p><\/div>\n<figure>\n            <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe_cards\/high_current\/about_img01.jpg\" alt=\"High-Current Probe Card\"><br \/>\n          <\/figure>\n<\/p><\/div>\n<div class=\"btn_wrap\">\n          <a href=\"..\/..\/probe\/high_current\/\" class=\"btn\">Learn More About High-Current Technology<\/a>\n        <\/div>\n<\/section>\n<div class=\"anchor\">\n<ul class=\"anchor_list container\">\n<li><a href=\"#feature\">Key Features &#038; Advantages<\/a><\/li>\n<li><a href=\"#usage\">Application Examples<\/a><\/li>\n<li><a href=\"#cases\">Custom solution examples<\/a><\/li>\n<li><a href=\"#related_products\">Related Products<\/a><\/li>\n<\/ul><\/div>\n<section id=\"feature\" class=\"container\">\n<h2>Key Features &#038; Advantages<\/h2>\n<div class=\"box -border\">\n<h3>01 High-current capability<\/h3>\n<div class=\"column2\">\n<div class=\"txt_wrap\">\n<p>Our probes are reinforced with CNT technology and a metal housing structure, greatly enhancing current endurance. Compared to traditional wire probes, the shorter terminal length delivers lower inductance, contributing to higher performance.<\/p>\n<\/p><\/div>\n<figure><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe_cards\/high_current\/feature_img01.jpg\" alt=\"Probe head\"><\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>02 Superior AC characteristics<\/h3>\n<div class=\"column2\">\n<div class=\"txt_wrap\">\n<p>By reducing the probe card height to less than half the conventional 30mm, we achieve significantly enhanced AC performance and improved measurement stability.<\/p>\n<\/p><\/div>\n<figure><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe_cards\/high_current\/feature_img02.jpg\" alt=\"\"><\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>03 Fully customizable solutions<\/h3>\n<p>Every probe card is custom-designed to integrate with your chip handlers and testers. Flexible manufacturing is available starting from a single unit to full-scale production.<\/p>\n<\/p><\/div>\n<\/section>\n<section id=\"usage\" class=\"container\">\n<div class=\"ttl_link\">\n<h2>Application Examples<\/h2>\n<p>          <a href=\"..\/..\/industry_category\/\" class=\"link\"><span>Explore more <\/span><\/a>\n        <\/div>\n<div class=\"column2\">\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe_cards\/high_current\/usage_img01.jpg\" alt=\"\"><\/div>\n<\/figure>\n<div class=\"txt_wrap\">\n<ul class=\"list -dotted\">\n<li>Power Devices (IGBTs, SiC, GaN devices)<\/li>\n<li>Power Semiconductors (High-Voltage MOSFETs, Diodes)<\/li>\n<\/ul><\/div>\n<\/p><\/div>\n<\/section>\n","protected":false},"excerpt":{"rendered":"<p>Pushing the Limits of High-Current Testing As automotive technologies such as IGBTs advance, the need for high [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":42,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-products-child.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-125","page","type-page","status-publish","hentry"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/125","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/comments?post=125"}],"version-history":[{"count":0,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/125\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/42"}],"wp:attachment":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/media?parent=125"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}