{"id":128,"date":"2025-07-25T11:56:12","date_gmt":"2025-07-25T02:56:12","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/wp\/?page_id=128"},"modified":"2025-08-24T18:41:56","modified_gmt":"2025-08-24T09:41:56","slug":"kelvin","status":"publish","type":"page","link":"https:\/\/www.seiken.co.jp\/english\/products\/probe_cards\/kelvin\/","title":{"rendered":"Kelvin Probe Card"},"content":{"rendered":"<section id=\"about\" class=\"container\">\n<h2>The precision solution for four-point probes method<\/h2>\n<div class=\"column2 -img2\">\n<div class=\"txt_wrap\">\n<p>Seiken\u2019s Kelvin probe cards are specifically engineered for four-terminal sensing (Kelvin connection) measurements, delivering highly accurate resistance testing for devices. By independently controlling the current (force circuit) and voltage (sense circuit), Kelvin measurements effectively eliminate the impact of contact resistance\u2014capturing the true device resistance (Rs) with precision.<br \/>\n              <br \/>In Kelvin measurements, two terminals must contact a single electrode, such as a solder bump or pad. Seiken\u2019s Kelvin probe cards support fine-pitch measurements starting from electrode pitches as small as 0.35mm. With the ability to reduce the terminal gap to just 0.1mm, stable and reliable contact is achievable even on ultra-small electrodes. (Patent No. 5597108 applies to this design.)<\/p>\n<p>Seiken offers complete support for the specialized board required for Kelvin probes. From custom fixture design to full manufacturing services, we provide a one-stop solution\u2014ensuring the perfect pairing between your probe card and testing equipment for maximum accuracy and efficiency.<\/p>\n<\/p><\/div>\n<figure>\n            <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe_cards\/kelvin\/about_img01.jpg\" alt=\"Kelvin Probe Card\"><br \/>\n          <\/figure>\n<\/p><\/div>\n<div class=\"btn_wrap\">\n          <a href=\"..\/..\/probe\/kelvin\/\" class=\"btn\">Kelvin Measurement Method\u200b<\/a><br \/>\n          <a href=\"..\/..\/probe\/kelvin\/#feature\" class=\"btn\">Kelvin Probes \u2013 Key Features &#038; What Sets Them Apart<\/a>\n        <\/div>\n<\/section>\n<div class=\"anchor\">\n<ul class=\"anchor_list container\">\n<li><a href=\"#feature\">Key Features &#038; Advantages<\/a><\/li>\n<li><a href=\"#usage\">Application Examples<\/a><\/li>\n<li><a href=\"#cases\">Custom solution examples<\/a><\/li>\n<li><a href=\"#related_products\">Related Products<\/a><\/li>\n<\/ul><\/div>\n<section id=\"feature\" class=\"container\">\n<h2>Key Features &#038; Advantages<\/h2>\n<div class=\"box -border\">\n<h3>01 Reliable contact with small electrodes<\/h3>\n<p>Designed for today\u2019s miniaturized technologies, ensuring stable contact even with ultra-small bumps as tiny as \u03c6180\u03bcm.<\/p>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>02 Flexible pin layout for multi-chip testing<\/h3>\n<div class=\"column2\">\n<div class=\"txt_wrap\">\n<p>Enjoy full design flexibility\u2014our Kelvin probe cards support layouts from 100 to 1000 electrodes per chip and allow for simultaneous multi-chip testing. All of our advanced probe cards have no limitations on pin arrangement, provided the pitch requirements are met.<\/p>\n<\/p><\/div>\n<figure><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe_cards\/kelvin\/feature_img01.jpg\" alt=\"Probe head\"><\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>03 Easy maintenance with replaceable pins<\/h3>\n<p>Maintaining peak performance is simple; our Kelvin probe cards allow for easy pin replacement, minimizing downtime and simplifying maintenance\u2014just like our advanced probe card models.<\/p>\n<\/p><\/div>\n<\/section>\n<section id=\"usage\" class=\"container\">\n<div class=\"ttl_link\">\n<h2>Application Examples<\/h2>\n<p>          <a href=\"..\/..\/industry_category\/\" class=\"link\"><span>Explore more <\/span><\/a>\n        <\/div>\n<div class=\"column2\">\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe_cards\/kelvin\/usage_img01.jpg\" alt=\"\"><\/div>\n<\/figure>\n<div class=\"txt_wrap\">\n<ul class=\"list -dotted\">\n<li>Semiconductor Front-End Testing<\/li>\n<\/ul><\/div>\n<\/p><\/div>\n<\/section>\n","protected":false},"excerpt":{"rendered":"<p>The precision solution for four-point probes method Seiken\u2019s Kelvin probe cards are specifically engineered fo [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":42,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-products-child.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-128","page","type-page","status-publish","hentry"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/128","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/comments?post=128"}],"version-history":[{"count":0,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/128\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/42"}],"wp:attachment":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/media?parent=128"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}