{"id":130,"date":"2025-07-25T11:59:30","date_gmt":"2025-07-25T02:59:30","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/wp\/?page_id=130"},"modified":"2025-08-12T18:50:25","modified_gmt":"2025-08-12T09:50:25","slug":"non_magnetic","status":"publish","type":"page","link":"https:\/\/www.seiken.co.jp\/english\/products\/probe_cards\/non_magnetic\/","title":{"rendered":"Non-Magnetic Probe Card"},"content":{"rendered":"<section id=\"about\" class=\"container\">\n<h2>Enabling High-Precision Testing in Non-Magnetic Environments<\/h2>\n<div class=\"column2 -img2\">\n<div class=\"txt_wrap\">\n<p>Seiken\u2019s non-magnetic probe cards are engineered from the ground up, backed by years of experience, very detail\u2014from material selection and precision machining to surface treatment, PCB manufacturing, and assembly\u2014is carefully managed within a fully integrated process. The result is a probe card that delivers consistently stable, high-precision inspections even in the most magnetically sensitive environments.<br \/>\n              <br \/>An optional socket kit further expands functionality, making these probe cards ideal for manual testing of packaged devices.<br \/>\n              <br \/>Ideal for testing components sensitive to magnetic fields\u2014such as electronic compasses\u30fcour non-magnetic probe cards provide reliable solutions where uncompromised measurement accuracy is essential.<\/p>\n<\/p><\/div>\n<div class=\"img_wrap column2\">\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe_cards\/non_magnetic\/about_img01.jpg\" alt=\"\"><figcaption>Non-Magnetic, Including PCB<\/figcaption><\/figure>\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe_cards\/non_magnetic\/about_img02.jpg\" alt=\"\"><figcaption>Non-Magnetic Probe Head:\u200b <br \/>Supports 200\u03bcm Pitch\u200b<\/figcaption><\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"btn_wrap\">\n          <a href=\"..\/..\/probe\/non_magnetic\/\" class=\"btn\">Learn More About Non-Magnetic Technology<\/a>\n        <\/div>\n<\/section>\n<div class=\"anchor\">\n<ul class=\"anchor_list container\">\n<li><a href=\"#feature\">Key Features &#038; Advantages<\/a><\/li>\n<li><a href=\"#usage\">Application Examples<\/a><\/li>\n<li><a href=\"#cases\">Custom solution examples<\/a><\/li>\n<li><a href=\"#related_products\">Related Products<\/a><\/li>\n<\/ul><\/div>\n<section id=\"feature\" class=\"container\">\n<h2>Key Features &#038; Advantages<\/h2>\n<div class=\"box -border\">\n<h3>01 Flexible probe pin array<\/h3>\n<p>With Seiken\u2019s advanced design capabilities, probe arrays can be flexibly configured to match the specific requirements of your device, ensuring optimal performance and precision.<\/p>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>02 Fine-pitch capability \u2014 Precision testing at 150\u00b5m pitch<\/h3>\n<p>Supports ultra-fine pitches down to 150\u00b5m, making it ideal for the high-precision testing of miniaturized electronic components.<\/p>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>03 Complete one-stop solution<\/h3>\n<p>From design through manufacturing and assembly, Seiken provides fully integrated production, delivering the optimal non-magnetic probe card tailored to your testing environment.<\/p>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>04 Small lot production available<\/h3>\n<p>Custom probe cards are available starting from a single unit, offering flexible support for prototypes, development projects, and specialized applications.<\/p>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>05 Socket kit option for manual testing<\/h3>\n<p>Enhance flexibility by adding an optional socket kit, allowing the same non-magnetic environment to be used for efficient manual testing of packaged devices.<\/p>\n<\/p><\/div>\n<\/section>\n<section id=\"usage\" class=\"container\">\n<div class=\"ttl_link\">\n<h2>Application Examples<\/h2>\n<p>          <a href=\"..\/..\/industry_category\/\" class=\"link\"><span>Explore more <\/span><\/a>\n        <\/div>\n<div class=\"column2\">\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe_cards\/non_magnetic\/usage_img01.jpg\" alt=\"\"><\/div>\n<\/figure>\n<div class=\"txt_wrap\">\n<ul class=\"list -dotted\">\n<li>Precision inspection of electronic compasses<\/li>\n<li>Characterization of Hall ICs<\/li>\n<li>Magnetic field influence testing for MR and MI sensors<\/li>\n<li>High-precision testing in environments sensitive to magnetic fields<\/li>\n<\/ul><\/div>\n<\/p><\/div>\n<\/section>\n","protected":false},"excerpt":{"rendered":"<p>Enabling High-Precision Testing in Non-Magnetic Environments Seiken\u2019s non-magnetic probe cards are engineered  [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":42,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-products-child.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-130","page","type-page","status-publish","hentry"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/130","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/comments?post=130"}],"version-history":[{"count":0,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/130\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/42"}],"wp:attachment":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/media?parent=130"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}