{"id":132,"date":"2025-07-25T12:02:12","date_gmt":"2025-07-25T03:02:12","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/wp\/?page_id=132"},"modified":"2025-08-24T17:56:19","modified_gmt":"2025-08-24T08:56:19","slug":"vertical_probe_card","status":"publish","type":"page","link":"https:\/\/www.seiken.co.jp\/english\/products\/probe_cards\/vertical_probe_card\/","title":{"rendered":"Advanced Probe Cards"},"content":{"rendered":"
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High-Precision Solutions for Efficient Wafer Testing<\/h2>\n
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Our advanced probe cards are essential tools for wafer-level testing in semiconductor manufacturing. These cards enable accurate testing of IC chips before they are mounted onto substrates, helping to detect defects early in the production process and improve overall product quality. By transmitting and receiving electrical signals to each pin on the wafer, probe cards gather vital test data\u2014ensuring each chip performs as expected. They play a critical role in identifying issues during the initial stages of semiconductor production.<\/p>\n

Boost Testing Efficiency with Advanced Vertical-Type Probe Cards: Unlike traditional cantilever-type probe cards, our advanced vertical-type design supports simultaneous multi-die testing and full-wafer measurements. This dramatically increases throughput and reduces testing time.<\/p>\n

Thanks to precision contact technology, these cards also support high-frequency and high-current testing with exceptional reliability. Their user-friendly design makes maintenance easy, minimizing downtime and maximizing productivity. Whether you’re aiming to streamline your testing process or improve measurement accuracy, we offer flexible solutions tailored to your requirements.<\/p>\n

\n Vertical vs. Cantilever Probe Cards<\/a>\n <\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/section>\n
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The Structure of Advanced Probe Cards<\/h2>\n

Seiken\u2019s advanced probe cards are engineered for excellence, featuring a probe head and a probe card substrate (PCB). Every probe head is designed and manufactured in-house, utilizing high-precision machining technology. This approach guarantees accuracy, and performance you can trust.<\/p>\n

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Probe head<\/h3>\n

Our probe heads are machined from engineering plastics or ceramics, shaped to fit your testing needs.<\/p>\n

Available materials include<\/h4>\n