{"id":150,"date":"2025-07-25T13:03:04","date_gmt":"2025-07-25T04:03:04","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/wp\/?page_id=150"},"modified":"2025-08-24T19:33:35","modified_gmt":"2025-08-24T10:33:35","slug":"description","status":"publish","type":"page","link":"https:\/\/www.seiken.co.jp\/english\/products\/ic_sockets\/description\/","title":{"rendered":"IC Test Sockets"},"content":{"rendered":"<section id=\"about\" class=\"container\">\n<h2>Supporting Your Testing Needs with Flexible Customization<\/h2>\n<div class=\"column2\">\n<div class=\"txt_wrap\">\n<p>After semiconductor chips are diced from the wafer, they are packaged into various formats such as BGA, QFP, and others.<br \/>IC sockets are vital to ensuring the quality of these packaged devices through electrical testing, securely holding the chip in place with accurate probe pins.<\/p>\n<\/p><\/div>\n<figure>\n            <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/ic_sockets\/description\/about_img01.jpg\" alt=\"IC Test Sockets\"><br \/>\n          <\/figure>\n<\/p><\/div>\n<\/section>\n<section id=\"structure\" class=\"container\">\n<h2>The Structure of IC Sockets<\/h2>\n<p>At Seiken, we offer expertly designed IC sockets that are tailored to the specific requirements of your package. From layout to selecting the best contact probes, we customize every aspect based on your device\u2019s shape, size, electrode design, materials, and surface treatments. Choose from a range of socket types to best suit your application:<\/p>\n<div class=\"column3\">\n<div class=\"box -border--thin\">\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/ic_sockets\/description\/structure_img01.png\" alt=\"\"><br \/>\n            <\/figure>\n<div class=\"txt_wrap\">\n<h3>Latch Type<\/h3>\n<p>A standard design perfect for multiple device testing, providing even pressure distribution with a convenient lid mechanism.<\/p>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"box -border--thin\">\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/ic_sockets\/description\/structure_img02.png\" alt=\"\"><br \/>\n            <\/figure>\n<div class=\"txt_wrap\">\n<h3>Clamshell Type<\/h3>\n<p>A hinged design that opens and closes easily, minimizing effort during repeated testing cycles.<\/p>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"box -border--thin\">\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/ic_sockets\/description\/structure_img03.png\" alt=\"\"><br \/>\n            <\/figure>\n<div class=\"txt_wrap\">\n<h3>Bottle Cap Type<\/h3>\n<p>Features an adjustable dial screw for fine control over contact pressure\u2014ideal for high-pin-count devices that require strong contact force.<\/p>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/section>\n<div class=\"anchor\">\n<ul class=\"anchor_list container\">\n<li><a href=\"#feature\">Key Features &#038; Advantages<\/a><\/li>\n<li><a href=\"#custom\">IC Socket Integration for Reliable Testing<\/a><\/li>\n<li><a href=\"#usage\">Application Examples<\/a><\/li>\n<li><a href=\"#cases\">Custom solution examples<\/a><\/li>\n<li><a href=\"#related_products\">Related Products<\/a><\/li>\n<\/ul><\/div>\n<section id=\"feature\" class=\"container\">\n<h2>Key Features &#038; Advantages<\/h2>\n<div class=\"box -border\">\n<h3>01 Full customization available<\/h3>\n<p>Seiken offers fully customized IC test sockets to meet your unique requirements. Whether it\u2019s adjusting dimensions, lid styles, or probe technologies\u2014including non-magnetic, high-frequency, high-current among other specifications\u2014we create tailored solutions that perfectly match your needs. We also welcome inquiries for custom requests that go beyond standard socket designs.<\/p>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>02 One-stop fixture design and production<\/h3>\n<p>Seiken provides an integrated service from design to manufacturing, including small-lot production starting from just one unit. Whether you require a single socket or a complete board with resin processing, socket assembly, and wiring design, we deliver solutions tailored to your testing environment.<\/p>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>03 Optimized Layouts for a wide range of IC packages<\/h3>\n<p>Our expert team will propose the best socket layout for your IC packages, streamlining your current testing processes while supporting future product innovations.<\/p>\n<\/p><\/div>\n<\/section>\n<section id=\"custom\" class=\"container\">\n<h2>IC Socket Integration for Reliable Testing<\/h2>\n<div class=\"column2 -img2\">\n<div class=\"txt_wrap\">\n<p>Testing IC packages traditionally involves time-consuming package replacements through multiple reflow cycles. With Seiken&#8217;s IC test sockets, you can easily swap packages without the hassle, improving testing efficiency.<\/p>\n<p>Backed by extensive experience and cutting-edge technology, Seiken delivers optimal IC socket solutions that ensure precision, reliability, and ease of use. Let us help turn your testing ideas into reality. For inquiries or custom requests, don\u2019t hesitate to contact us.<\/p>\n<\/p><\/div>\n<div class=\"img_wrap column2\">\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/ic_sockets\/description\/custom_img01.jpg\" alt=\"IC Socket Integration for Reliable Testing\"><br \/>\n            <\/figure>\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/ic_sockets\/description\/custom_img02.jpg\" alt=\"IC Socket Integration for Reliable Testing\"><br \/>\n            <\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<\/section>\n<section id=\"usage\" class=\"container\">\n<div class=\"ttl_link\">\n<h2>Application Examples<\/h2>\n<p>          <a href=\"..\/..\/industry_category\/\" class=\"link\"><span>Explore more <\/span><\/a>\n        <\/div>\n<div class=\"column2\">\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/ic_sockets\/description\/usage_img01.jpg\" alt=\"\"><\/div>\n<\/figure>\n<div class=\"txt_wrap\">\n<ul class=\"list -dotted\">\n<li>Packaged Chips<\/li>\n<li>New Device Prototypes<\/li>\n<li>Diced Chips<\/li>\n<li>BGA, QFP<\/li>\n<li>Modules, and More<\/li>\n<\/ul><\/div>\n<\/p><\/div>\n<\/section>\n","protected":false},"excerpt":{"rendered":"<p>Supporting Your Testing Needs with Flexible Customization After semiconductor chips are diced from the wafer,  [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":44,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-products-child.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-150","page","type-page","status-publish","hentry"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/150","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/comments?post=150"}],"version-history":[{"count":0,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/150\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/44"}],"wp:attachment":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/media?parent=150"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}