{"id":57,"date":"2025-07-19T21:49:04","date_gmt":"2025-07-19T12:49:04","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/wp\/?page_id=57"},"modified":"2025-07-31T20:05:49","modified_gmt":"2025-07-31T11:05:49","slug":"industry_category","status":"publish","type":"page","link":"https:\/\/www.seiken.co.jp\/english\/products\/industry_category\/","title":{"rendered":"Introduction of Testing Fixtures by Category"},"content":{"rendered":"\n<div class=\"anchor\">\n<ul class=\"anchor_list container\">\n<li><a href=\"#semiconductor\">Semiconductors<\/a><\/li>\n<li><a href=\"#pcb\">Printed Circuit Boards (PCB)<\/a><\/li>\n<li><a href=\"#electronic\">Electronic Components<\/a><\/li>\n<li><a href=\"#other\">Others<\/a><\/li>\n<\/ul><\/div>\n<section id=\"semiconductor\" class=\"container\">\n<h2>Semiconductors<\/h2>\n<p>We deliver tailored, high-precision solutions for every stage of semiconductor and PCB inspection\u2014from early wafer-level testing to final quality checks post-packaging. Whether you&#8217;re dealing with fine-pitch layouts, high-current demands, non-magnetic environments, or high-frequency signals, our technologies are engineered to meet your specific testing challenges with accuracy and efficiency.<\/p>\n<div class=\"semicon_table\">\n<div class=\"semicon_table_ttl\">\n<div class=\"-pre\">\n<p class=\"label\">Front-End Process<\/p>\n<\/p><\/div>\n<div class=\"-post\">\n<p class=\"label\">Back-End Process<\/p>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"semicon_table_process\">\n<p class=\"txt\">Wafer-Level Testing<\/p>\n<p class=\"txt\">Final Package Testing<\/p>\n<\/p><\/div>\n<div class=\"semicon_table_box -production\">\n<p class=\"ttl\">Manufacturing<\/p>\n<div class=\"column2\">\n<div class=\"box -border -pre\">\n<figure><figcaption>Silicon wafers<\/figcaption><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img01.jpg\" alt=\"\"><br \/>\n                <\/figure>\n<figure><figcaption>Diced wafers<br class=\"-sp\">(bare dies)<\/figcaption><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img02.jpg\" alt=\"\"><br \/>\n                <\/figure>\n<\/p><\/div>\n<div class=\"box -border -post\">\n<figure><figcaption>Package and module testing<\/figcaption><picture><source srcset=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img03_sp.jpg\" media=\"(max-width:767px)\"><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img03_pc.jpg\" alt=\"\">\n                  <\/picture>\n                <\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"semicon_table_box -inspection\">\n<p class=\"ttl\">Testing<\/p>\n<div class=\"column2\">\n<div class=\"box -probe_cards\">\n<p class=\"box_ttl\">Advanced Probe Cards<\/p>\n<div class=\"column4\">\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img04.jpg\" alt=\"\"><\/div><figcaption>Fine-Pitch<\/figcaption><\/figure>\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img05.jpg\" alt=\"\"><\/div><figcaption>High-Current<\/figcaption><\/figure>\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img06.jpg\" alt=\"\"><\/div><figcaption>Non-Magnetic<\/figcaption><\/figure>\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img07.jpg\" alt=\"\"><\/div><figcaption>Kelvin<\/figcaption><\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"box -ic_sockets\">\n<p class=\"box_ttl\">IC socket evaluation<\/p>\n<div class=\"column4\">\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img08.jpg\" alt=\"\"><\/div><figcaption>High-Current<\/figcaption><\/figure>\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img09.jpg\" alt=\"\"><\/div><figcaption>Kelvin<\/figcaption><\/figure>\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img10.jpg\" alt=\"\"><\/div><figcaption>Non-Magnetic<\/figcaption><\/figure>\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img11.jpg\" alt=\"\"><\/div><figcaption>High-Frequency<\/figcaption><\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"box -probe\">\n<p class=\"box_ttl\">Probe Technologies<\/p>\n<div class=\"column4\">\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img12.jpg\" alt=\"\"><\/div><figcaption>High-Frequency Probes<\/figcaption><\/figure>\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img13.jpg\" alt=\"\"><\/div><figcaption>High-current Probes<\/figcaption><\/figure>\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img14.jpg\" alt=\"\"><\/div><figcaption>Double Ended Probes<\/figcaption><\/figure>\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/semicon_img15.jpg\" alt=\"\"><\/div><figcaption>Non-Magnetic Probes<\/figcaption><\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/section>\n<section id=\"pcb\" class=\"container\">\n<h2>Printed Circuit Boards (PCB)<\/h2>\n<p>We support printed circuit board (PCB) inspection\u2014both at the bare board stage and after component assembly.<\/p>\n<div class=\"inspection_box -border\">\n<h3>Items subject to inspection<\/h3>\n<div class=\"column3\">\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/pcb_img01.jpg\" alt=\"\"><figcaption>Bare PCBs<\/figcaption><\/figure>\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/pcb_img02.jpg\" alt=\"\"><figcaption>Assembled PCBs<\/figcaption><\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"inspection_box -bg\">\n<h3>Inspection Fixtures<\/h3>\n<div class=\"column3\">\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/pcb_img03.jpg\" alt=\"\"><figcaption>Bare board test fixtures<\/figcaption><\/figure>\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/pcb_img04.jpg\" alt=\"\"><figcaption>Function Test Fixture<br class=\"-sp\">Type 1 (example)<\/figcaption><\/figure>\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/pcb_img05.jpg\" alt=\"\"><figcaption>Function Test Fixture<br class=\"-sp\">Type 2 (example)<\/figcaption><\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<\/section>\n<section id=\"electronic\" class=\"container\">\n<h2>Electronic Components<\/h2>\n<p>We support a wide range of inspections using test fixtures equipped with contact probes and specialized terminals. Whether your requirements involve fine-pitch components, high-current applications, non-magnetic materials, high-frequency measurements, among others, we offer optimal solutions customized to your specific testing environment.<\/p>\n<div class=\"inspection_box -border\">\n<h3>Items subject to inspection<\/h3>\n<div class=\"column3\">\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/electronic_img01.jpg\" alt=\"\"><figcaption>Discrete components<\/figcaption><\/figure>\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/electronic_img02.jpg\" alt=\"\"><figcaption>Connectors<\/figcaption><\/figure>\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/electronic_img03.jpg\" alt=\"\"><figcaption>FPD<\/figcaption><\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"inspection_box -bg\">\n<h3>Inspection Fixtures<\/h3>\n<div class=\"column3\">\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/electronic_img04.jpg\" alt=\"\"><figcaption>IC Test Sockets<\/figcaption><\/figure>\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/electronic_img05.jpg\" alt=\"\"><figcaption>Connectors<\/figcaption><\/figure>\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/industry_category\/electronic_img06.jpg\" alt=\"\"><figcaption>Test Fixtures<\/figcaption><\/figure>\n<\/p><\/div>\n<\/p><\/div>\n<\/section>\n<section id=\"other\" class=\"container\">\n<h2>Others<\/h2>\n<p>From semiconductors and electronic components to automotive, aerospace, medical, telecom, energy, and robotics\u2014Seiken\u2019s contact probes and inspection fixtures are trusted across a wide range of industries.<br \/>\n          <br \/>Whether you&#8217;re in R&#038;D, mass production, or custom product development, our flexible approach and deep expertise allow us to turn your ideas into test-ready realities.  We also support related applications, including connector testing and early-stage product development.<br \/>\n          <br \/>Facing a complex inspection or connection challenge? Let\u2019s solve it\u2014together. We deliver precision and drive innovation.<\/p>\n<\/section>\n","protected":false},"excerpt":{"rendered":"<p>Semiconductors Printed Circuit Boards (PCB) Electronic Components Others Semiconductors We deliver tailored, h [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":37,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-products-category-top.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-57","page","type-page","status-publish","hentry"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/57","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/comments?post=57"}],"version-history":[{"count":0,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/57\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/37"}],"wp:attachment":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/media?parent=57"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}