{"id":83,"date":"2025-07-24T10:22:25","date_gmt":"2025-07-24T01:22:25","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/wp\/?page_id=83"},"modified":"2026-04-20T11:32:00","modified_gmt":"2026-04-20T02:32:00","slug":"difference_vertical_cantilever","status":"publish","type":"page","link":"https:\/\/www.seiken.co.jp\/english\/products\/probe_cards\/difference_vertical_cantilever\/","title":{"rendered":"Vertical vs. Cantilever Probe Cards:
Choosing the Right Solution for Your Testing Needs"},"content":{"rendered":"
\n
\n

What is a Probe Card?<\/h2>\n

A probe card is a key component in the semiconductor testing process, used to make electrical contact during inspection. Semiconductor testing can be broadly divided into front-end (wafer-level) testing and back-end (package) testing (e.g., BGA, CSP, QFN). Probe cards play a vital role in wafer testing during the front-end stage.
\n
There are two main types of probe cards: advanced vertical type and cantilever type. At Seiken, we specialize in advanced vertical-type probe cards built with our proprietary contact probe technology, delivering superior performance and flexible solutions tailored to your unique testing requirements.<\/p>\n

\n

At Seiken, we exclusively offer advanced (vertical) probe cards<\/span> based on contact probe technology.
\nPlease note that cantilever-type probe cards are not part of our product lineup<\/span>.<\/p>\n<\/p><\/div>\n<\/section>\n

\n

Why Choose Vertical-Type Probe Cards?<\/h2>\n
\n
\n

Vertical probe cards, also known as advanced probe cards, feature vertically aligned terminals (probes) mounted on modular blocks, allowing for high precision and easy customization.<\/span><\/p>\n

    \n
  • Flexible Layouts: <\/span>Supports various configurations, ideal for grid patterns and multi-site testing.<\/li>\n
  • Optimized for Maintenance: <\/span>Individual probes can be replaced easily, reducing downtime.<\/li>\n
  • Reduced Wafer Damage: <\/span>Vertical contact minimizes probe marks, reducing damage to the wafer.<\/li>\n
  • Solder Bump Compatibility: <\/span>Gentle contact prevents damage to fragile solder surfaces.<\/li>\n<\/ul><\/div>\n
    \n \"Vertical-Type
    \n <\/figure>\n<\/p><\/div>\n<\/section>\n
    \n

    Understanding Cantilever-Type Probe Cards<\/h2>\n
    \n
    \n

    Cantilever probe cards use needle-like tungsten probes\u2014resembling the teeth of a rake\u2014that extend directly from the board without housings.<\/span><\/p>\n

      \n
    • Lower Cost: <\/span>The housing-free design offers a cost advantage over vertical-type probe cards.<\/li>\n
    • Fine Pitch Compatibility: <\/span>Good for narrow electrode spacing.<\/li>\n
    • Strong Aluminum Contact: <\/span>Reliable contact with aluminum electrodes.<\/li>\n<\/ul><\/div>\n
      \n \"Cantilever-Type
      \n <\/figure>\n<\/p><\/div>\n<\/section>\n
      \n

      Understanding the Pros and Cons of Vertical and Cantilever Probe Cards<\/h2>\n\n\n\n\n\n\n\n\n\n
      Characteristics<\/th>\nVertical Type<\/th>\nCantilever Type<\/th>\n<\/tr>\n<\/thead>\n
      Pin Layout<\/th>\n\n

      Highly flexible; perfect for complex multi-site testing<\/p>\n<\/td>\n

      		\n

      Limited to peripheral layouts with angled contact<\/p>\n<\/td>\n<\/tr>\n

      Maintenance<\/th>\n\n

      Easy, in-house pin replacement<\/p>\n<\/td>\n

      		\n

      Requires precision adjustments; external repair often needed<\/p>\n<\/td>\n<\/tr>\n

      Probe Marks<\/th>\n\n

      Minimal (vertical contact)<\/p>\n<\/td>\n

      		\n

      Larger marks (sliding contact)<\/p>\n<\/td>\n<\/tr>\n

      Aluminum Pads<\/th>\n\n

      Less suitable, but adaptable with Seiken’s technology<\/p>\n<\/td>\n

      		\n

      Strong resistance to oxide layers enables stable contact<\/p>\n<\/td>\n<\/tr>\n

      Cost<\/th>\n\n

      Higher initial investment<\/p>\n<\/td>\n

      		\n

      More cost-effective to implement<\/p>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

      At Seiken, we don\u2019t just deliver products\u2014we solve problems. Our vertical-type probe cards offer the reliability and customization needed to meet your challenges head-on.
      \n
      Have questions or specific testing needs? Let\u2019s talk. We\u2019re here to find the right probe card solution for your application.<\/p>\n<\/section>\n","protected":false},"excerpt":{"rendered":"

      What is a Probe Card? A probe card is a key component in the semiconductor testing process, used to make elect […]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":42,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-products-child.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-83","page","type-page","status-publish","hentry"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/83","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/comments?post=83"}],"version-history":[{"count":0,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/83\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/42"}],"wp:attachment":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/media?parent=83"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}