{"id":87,"date":"2025-07-24T15:26:49","date_gmt":"2025-07-24T06:26:49","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/wp\/?page_id=87"},"modified":"2025-08-24T19:27:16","modified_gmt":"2025-08-24T10:27:16","slug":"bias","status":"publish","type":"page","link":"https:\/\/www.seiken.co.jp\/english\/products\/probe\/bias\/","title":{"rendered":"Resistance Stabilization Technology"},"content":{"rendered":"<section id=\"about\" class=\"container\">\n<h2>Revolutionizing Your Test Solutions<\/h2>\n<div class=\"column2 -img2\">\n<div class=\"txt_wrap\">\n<p>\n              At Seiken, we support stable resistance measurements through our advanced bias probe technology. By integrating a conductive bias ball inside a vertical (pogo-type) probe, uniform contact pressure is applied between the plunger and the inner wall of the barrel. This design significantly reduces contact wear and resistance variation\u2014ensuring highly accurate and consistent electrical measurements, even during long-duration burn-in or high-reliability testing.<br \/>\n              <br \/>Traditional designs faced challenges such as internal damage or scratching due to excessive pressure on the probe barrel, and were not well-suited for fine-pitch applications due to bias ball size limitations. Seiken has developed a breakthrough solution that overcomes these issues.\n            <\/p>\n<\/p><\/div>\n<figure>\n              <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/bias\/about_img01.jpg\" alt=\"Resistance Stabilization Technology\"><br \/>\n            <\/figure>\n<\/p><\/div>\n<\/section>\n<div class=\"anchor\">\n<ul class=\"anchor_list container\">\n<li><a href=\"#feature\">Key Features &#038; Advantages<\/a><\/li>\n<li><a href=\"#usage\">Application Examples<\/a><\/li>\n<li><a href=\"#cases\">Custom solution examples<\/a><\/li>\n<li><a href=\"#related_products\">Related Products<\/a><\/li>\n<\/ul><\/div>\n<section id=\"feature\" class=\"container\">\n<h2>Key Features &#038; Advantages<\/h2>\n<div class=\"box -border\">\n<h3>01 Stable contact performance<\/h3>\n<p>With over 100,000 test cycles of proven performance, Seiken\u2019s bias probes deliver consistent contact and minimized resistance variation, even under current load. This stability makes them ideal for demanding testing environments that require precision and durability.<\/p>\n<div class=\"column2\">\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/bias\/feature_img01.jpg\" alt=\"Standard Probe\"><\/div>\n<\/figure>\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/bias\/feature_img02.jpg\" alt=\"New-Bias Probe\"><\/div>\n<\/figure><\/div>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>02 Optimized for size reduction<\/h3>\n<p>As electronic components continue to shrink, Seiken now offers bias probe structures that support pitch sizes as small as 0.4mm. This enables highly accurate low-resistance measurements while minimizing the natural resistance variation inherent in traditional contact probes.<\/p>\n<\/p><\/div>\n<div class=\"box -border\">\n<h3>03 Enhanced durability<\/h3>\n<p>Our precision manufacturing ensures ideal contact performance while evenly distributing pressure within the probe barrel. This reduces the risk of damage or scratching (galling) over repeated use\u2014greatly improving durability and test consistency over time.<\/p>\n<\/p><\/div>\n<\/section>\n<section id=\"usage\" class=\"container\">\n<div class=\"ttl_link\">\n<h2>Application Examples<\/h2>\n<p>          <a href=\"..\/..\/industry_category\/\" class=\"link\"><span>Explore more <\/span><\/a>\n        <\/div>\n<div class=\"column2\">\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/bias\/usage_img01.jpg\" alt=\"\"><\/div>\n<\/figure>\n<div class=\"txt_wrap\">\n<ul class=\"list -dotted\">\n<li>Crystal devices<\/li>\n<li>High-current devices<\/li>\n<li>Any test requiring enhanced probe resistance stability<\/li>\n<\/ul><\/div>\n<\/p><\/div>\n<\/section>\n","protected":false},"excerpt":{"rendered":"<p>Revolutionizing Your Test Solutions At Seiken, we support stable resistance measurements through our advanced  [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":39,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-products-child.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-87","page","type-page","status-publish","hentry"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/87","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/comments?post=87"}],"version-history":[{"count":0,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/87\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/39"}],"wp:attachment":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/media?parent=87"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}