{"id":97,"date":"2025-07-25T10:51:05","date_gmt":"2025-07-25T01:51:05","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/wp\/?page_id=97"},"modified":"2025-08-28T10:21:48","modified_gmt":"2025-08-28T01:21:48","slug":"custom_products","status":"publish","type":"page","link":"https:\/\/www.seiken.co.jp\/english\/products\/probe\/custom_products\/","title":{"rendered":"Custom-Designed Probes"},"content":{"rendered":"<section id=\"about\" class=\"container\">\n<h2>Optimized Solutions Tailored to Your Testing Environment<\/h2>\n<div class=\"column2\">\n<div class=\"txt_wrap\">\n<p>At Seiken, we know that one probe doesn\u2019t fit all when it comes to testing. That\u2019s why, in addition to our reliable lineup of single-ended spring probes, we offer fully customized solutions to fit your unique needs. Need something beyond the standard? We\u2019ve got you covered\u2014from probe pins and IC sockets to probe cards and testing jigs. Whether you need a small tweak to an existing part or a brand-new design, we\u2019ll make it happen. We also provide replacements for discontinued third-party products, so your testing process stays smooth and uninterrupted. Tell us what you need\u2014we\u2019ll build it for you.<\/p>\n<\/p><\/div>\n<figure>\n            <img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/custom_products\/about_img01.jpg\" alt=\"\"><br \/>\n          <\/figure>\n<\/p><\/div>\n<\/section>\n<section id=\"customise\" class=\"container\">\n<h2>Customization Tailored to DUT Characteristics and Test System Requirements<br \/>\n<\/h2>\n<h3>Modifications that Match Your Testing Needs<\/h3>\n<div class=\"column3\">\n<div class=\"box -gray\">\n<h4>Fully customizable to fit your needs<\/h4>\n<p>We offer a wide range of customization options, including: Custom tip shapes, stroke length adjustment, Pipe length variations, Spring force optimization amd more. Our goal is to provide the perfect probe for your exact application.<\/p>\n<\/p><\/div>\n<div class=\"box -gray\">\n<h4>Advanced materials &#038; surface treatment<\/h4>\n<p>To reduce contact failures and wear, we carefully select alloys and surface treatments that best match your testing conditions. This ensures greater reliability, even under challenging environments.<\/p>\n<\/p><\/div>\n<div class=\"box -gray\">\n<h4>Precision engineering for fine-pitch<\/h4>\n<p>Using advanced precision machining, we support applications requiring extremely fine pitch or miniature contact areas. Even for difficult dimensions or force requirements, our custom probes deliver performance that standard products can&#8217;t match.<\/p>\n<\/p><\/div>\n<\/p><\/div>\n<h3>Maximizing Test Performance Through Customized Probe Material Solutions<\/h3>\n<p>In different testing environments, the reliability of probes plays a crucial role in achieving accurate, stable measurements. One of the most effective ways to ensure this is by selecting the optimal probe materials tailored to your specific test conditions.<br \/>\n          <br \/>In cases where durability is a concern, changing the material or surface treatment can help extend the probe\u2019s lifespan. However, it is also important to consider potential side effects, such as an increase in resistance. By carefully choosing the right materials and surface treatments for each situation, we help our customers avoid common issues such as premature wear, unstable resistance, or contact failure.<\/p>\n<table class=\"table -sp_vertical\">\n<thead>\n<tr>\n<th>Test Environment<\/th>\n<th>Challenge \/ Requirement<\/th>\n<th>Our Solution<\/th>\n<\/tr>\n<\/thead>\n<tbody>\n<tr>\n<th>High-current environments<\/th>\n<td>\n<p>Need for stable high current tests<\/p>\n<\/td>\n<td>\n<p><a href=\"..\/high_current\/\">Use CNT (carbon nanotube) plating<\/a><\/p>\n<\/td>\n<\/tr>\n<tr>\n<th>Magnetic-sensitive environments<\/th>\n<td>\n<p>Avoid magnetic interference<\/p>\n<\/td>\n<td>\n<p><a href=\"..\/non_magnetic\/\">Use non-magnetic materials to maintain signal integrity<\/a><\/p>\n<\/td>\n<\/tr>\n<p>            <!-- \n\n<tr>\n              \n\n<th>Multi-contact testing<\/th>\n\n\n              \n\n<td>\n\n<p>Probe wear due to multiple contact testing<\/p>\n\n<\/td>\n\n\n              \n\n<td>\n\n<p><a href=\"\">Use harder materials to extend probe life and reduce maintenance<\/a><\/p>\n\n<\/td>\n\n\n            <\/tr>\n\n --><\/p>\n<tr>\n<th>Low-resistance measurement<\/th>\n<td>\n<p>Minimize resistance fluctuation and achieve high-precision measurement<\/p>\n<\/td>\n<td>\n<p><a href=\"..\/bias\/\">Add specialized parts for greater measurement stability<\/a><\/p>\n<\/td>\n<\/tr>\n<tr>\n<th>Lead-free solder environments<\/th>\n<td>\n<p>Prevent solder transfer and avoid contact failures<\/p>\n<\/td>\n<td>\n<p><a href=\"..\/lead_free_solder\/\">Use alloy plungers<\/a><\/p>\n<\/td>\n<\/tr>\n<tr>\n<th>High-temperature conditions<\/th>\n<td>\n<p>Maintain stable measurements under high temperatures<\/p>\n<\/td>\n<td>\n<p><a href=\"..\/heat_resistance\/\">Use spring materials designed for heat resistance<\/a><\/p>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>Our strength lies in providing tailored material and structural solutions that maximize both reliability and performance\u2014ensuring your testing processes run smoothly, even in the most demanding environments.<br \/>\n          <br \/>If you&#8217;re facing challenges with your current testing setup or have specific requirements, our team is here to help with expert guidance and customized recommendations. Contact us to explore how we can support your testing goals.<\/p>\n<\/section>\n<section id=\"solve\" class=\"container\">\n<h2>Real-World Testing Challenges \u2014 and How we solve them<\/h2>\n<p>Testing isn\u2019t always smooth sailing \u2014 and we understand the frustration of poor contact or performance drops. That\u2019s why we\u2019ve designed targeted solutions to solve the most common probe-related issues and help you get the accuracy and reliability you need.<\/p>\n<div class=\"column3\">\n<div class=\"solve_content\">\n<h3>Insufficient contact force<\/h3>\n<dl class=\"box -gray\">\n<dt>Concern<\/dt>\n<dd>\n<p>Weak internal contact or low spring force leads to high resistance.<\/p>\n<\/dd>\n<\/dl>\n<dl class=\"box -border--thin\">\n<dt>Solution<\/dt>\n<dd>\n<p>We customize the spring force to boost performance. For high-heat environments, switching to stainless steel (SUS) springs helps maintain long-term stability.<\/p>\n<\/dd>\n<\/dl><\/div>\n<div class=\"solve_content\">\n<h3>Tip deformation<\/h3>\n<dl class=\"box -gray\">\n<dt>Concern<\/dt>\n<dd>\n<p>Probes wear out from repeated contact with hard terminals, reducing their effectiveness.<\/p>\n<\/dd>\n<\/dl>\n<dl class=\"box -border--thin\">\n<dt>Solution<\/dt>\n<dd>\n<p>We use materials like SK steel and fine-tune the tip shape to improve durability and maintain strong contact.<\/p>\n<\/dd>\n<\/dl><\/div>\n<div class=\"solve_content\">\n<h3>Tip surface degradation<\/h3>\n<dl class=\"box -gray\">\n<dt>Concern<\/dt>\n<dd>\n<p>Plating peels off over time, exposing the base metal to oxidation and raising resistance.<\/p>\n<\/dd>\n<\/dl>\n<dl class=\"box -border--thin\">\n<dt>Solution<\/dt>\n<dd>\n<p>We switch to oxidation-resistant alloys and solder-resistant materials. For top-tier performance, CNT plating increases current capacity, and routine cleaning prevents debris buildup.<\/p>\n<\/dd>\n<\/dl><\/div>\n<\/p><\/div>\n<\/section>\n<section id=\"usage\" class=\"container\">\n<div class=\"ttl_link\">\n<h2>Application Examples<\/h2>\n<p>          <a href=\"..\/..\/industry_category\/\" class=\"link\"><span>Explore more <\/span><\/a>\n        <\/div>\n<div class=\"column2\">\n<figure class=\"-border\">\n<div><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/custom_products\/usage_img01.jpg\" alt=\"\"><\/div>\n<\/figure>\n<div class=\"txt_wrap\">\n<ul class=\"list -dotted\">\n<li>Testing of various electronic components<\/li>\n<li>Prototyping for R&#038;D<\/li>\n<li>High-precision probing and evaluation<\/li>\n<\/ul><\/div>\n<\/p><\/div>\n<\/section>\n<section class=\"container\">\n<h2>Everything You Need \u2013 Complete Fixture Manufacturing, Including Boards, Tailored to Your Specifications<\/h2>\n<h3>More Than Just Probes!<\/h3>\n<div class=\"column2\">\n<div class=\"txt_wrap\">\n<p>At Seiken, we don\u2019t just stop at probe pins. We design and manufacture full test jigs\u2014including the PCBs\u2014to give you an absolute, high-performance testing experience. For example:<\/p>\n<ul class=\"list -dotted\">\n<li>High-Current Testing: We choose the right probe materials and integrate them into metal-based boards to safely manage heavy current loads.<\/li>\n<li>High-Frequency Testing: Our boards feature coaxial structures designed to meet strict signal integrity and frequency performance requirements.<\/li>\n<li>Fine-Pitch Dual-Ended Probes: From precise board processing to full assembly, we provide end-to-end support for even the most compact and complex configurations.<\/li>\n<\/ul>\n<p>No matter your testing challenge, we\u2019re ready with the expertise and solutions to match.\u3000<br \/>Let\u2019s build something that works perfectly for you\u2014just reach out!<\/p>\n<\/p><\/div>\n<figure><img decoding=\"async\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/themes\/wp-seiken-en\/assets\/images\/products\/probe\/custom_products\/bord_img01.jpg\" alt=\"\"><\/figure>\n<\/p><\/div>\n<\/section>\n<section class=\"container\">\n<div class=\"box -border\">\n<h2>Got a question? Let us know!<br \/>From product selection to setup, our team is ready to help.<\/h2>\n<div class=\"btn_wrap\">\n            <a href=\"..\/..\/..\/faq\/\" class=\"btn\">FAQ<\/a><br \/>\n            <a href=\"..\/..\/..\/contact_us\" class=\"btn -contact\">Contact us here<\/a>\n          <\/div>\n<\/p><\/div>\n<\/section>\n","protected":false},"excerpt":{"rendered":"<p>Optimized Solutions Tailored to Your Testing Environment At Seiken, we know that one probe doesn\u2019t fit all whe [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":39,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-products-child.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-97","page","type-page","status-publish","hentry"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/97","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/comments?post=97"}],"version-history":[{"count":0,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/97\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/pages\/39"}],"wp:attachment":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/media?parent=97"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}