{"id":691,"date":"2026-02-02T10:00:00","date_gmt":"2026-02-02T01:00:00","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/?p=691"},"modified":"2026-01-29T14:26:25","modified_gmt":"2026-01-29T05:26:25","slug":"testconx-2026-join-us-at-booth-71","status":"publish","type":"post","link":"https:\/\/www.seiken.co.jp\/english\/news\/1007\/","title":{"rendered":"TestConX 2026 \u2013 Join Us at Booth 71"},"content":{"rendered":"\n<h3 class=\"wp-block-heading\"><strong>Where the Forefront of Semiconductor Testing Comes Together<\/strong><\/h3>\n\n\n\n<p><strong>TestConX 2026<\/strong>, one of the world\u2019s most respected conference focused on semiconductor testing and burn-in technologies, will feature our company as an exhibitor.<br>This premier global event brings together <strong>semiconductor test engineers, QA professionals, equipment suppliers, and technology leaders<\/strong> to share knowledge, explore emerging trends, and tackle real-world testing challenges.<br>If you are involved in <strong>semiconductor test development, test automation, inspection, or quality assurance<\/strong>, this is a must-attend event.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\"><strong>What Is TestConX? <\/strong><\/h3>\n\n\n\n<p>TestConX showcases breakthroughs in semiconductor testing and highlights the latest practical technologies and methods. Industry professionals widely recognize it as a leading workshop and conference dedicated to electronic and semiconductor testing. Key areas include:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Test consumables such as test sockets, probes, etc.<\/li>\n\n\n\n<li>Semiconductor test systems and handlers<\/li>\n\n\n\n<li>Burn-in and reliability testing<\/li>\n\n\n\n<li>Advanced packaging test and system-level test<\/li>\n\n\n\n<li>Validation, inspection, and finished-product testing<\/li>\n<\/ul>\n\n\n\n<p>The event features <strong>technical presentations, keynote sessions, panel discussions, hands-on workshops, and exhibitions<\/strong>,that provide both strategic insight and practical, field-proven solutions.<\/p>\n\n\n\n<p>Over the years, the event has expanded beyond final test and burn-in to cover <strong>advanced packaging, validation, and real-world manufacturing challenges<\/strong>. Today, it plays a vital role in the evolving semiconductor landscape.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Event Overview | TestConX 2026<\/strong><\/h2>\n\n\n\n<figure class=\"wp-block-flexible-table-block-table\"><table class=\"has-fixed-layout\"><tbody><tr><th style=\"width:25%\"><strong>Event<\/strong><\/th><td>TestConX 2026<\/td><\/tr><tr><th style=\"width:25%\"><strong>Dates<\/strong><\/th><td>March 1\u20134, 2026<\/td><\/tr><tr><th style=\"width:25%\"><strong>Venue<\/strong><\/th><td><a href=\"https:\/\/www.hilton.com\/en\/hotels\/meswhdt-doubletree-phoenix-mesa\/\" title=\"\">DoubleTree by Hilton<\/a> Phoenix Mesa<\/td><\/tr><tr><th style=\"width:25%\"><strong>Booth Number<\/strong><\/th><td><strong>No. 71<\/strong><\/td><\/tr><tr><th style=\"width:25%\"><strong>Official Website<\/strong><\/th><td><a href=\"https:\/\/www.testconx.org\/premium\/testconx2026\/\" title=\"\">https:\/\/www.testconx.org\/premium\/testconx2026\/<\/a><\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Who Should Attend TestConX 2026?<\/strong><\/h2>\n\n\n\n<p>Professionals from across the global semiconductor ecosystem attend TestConX, including:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Engineers facing challenges in <strong>semiconductor testing or quality assurance (QA)<\/strong><\/li>\n\n\n\n<li>Teams working on <strong>test automation and process improvement<\/strong><\/li>\n\n\n\n<li>Professionals seeking <strong>practical, field-based advice<\/strong><\/li>\n\n\n\n<li>Semiconductor test engineers and technicians working in test design, burn-in, and advanced package inspection <\/li>\n\n\n\n<li>Developers and designers of test-related products such as test sockets, fixtures, and PCBs<\/li>\n\n\n\n<li>R&amp;D, manufacturing, QA, and process improvement professionals<\/li>\n<\/ul>\n\n\n\n<p>In short, <strong>anyone seeking solutions, insight, or collaboration opportunities in semiconductor test and burn-in<\/strong> will benefit from attending.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\"><strong>Proven Experience in Solving Testing Challenges<\/strong><\/h3>\n\n\n\n<p>At TestConX 2025, we proudly received an <strong>award for our poster presentation<\/strong>, where we introduced technologies that might help to solve real-world testing issues.<\/p>\n\n\n\n<p>The presentation led to in-depth discussions with test engineers and industry professionals from around the world, reinforcing our commitment to <strong>practical, on-site problem solving<\/strong> rather than theoretical solutions.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Our Focus at TestConX 2026<\/strong><\/h2>\n\n\n\n<p><strong>Solving Real-World Semiconductor Testing Problems<\/strong><\/p>\n\n\n\n<p>While we will not be presenting a poster this year, emphasis at <strong>TestConX 2026<\/strong> will be placed on <strong>direct, face-to-face technical discussions at the exhibition booth<\/strong>.<\/p>\n\n\n\n<p>At <strong>Booth 71<\/strong>, discussions are welcomed on topics such as:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Improving the performance of <strong>test probes<\/strong><\/li>\n\n\n\n<li>Solving issues with <strong>inspection jigs or test fixtures<\/strong><\/li>\n\n\n\n<li>Tests that are <strong>not performing as expected in production<\/strong><\/li>\n\n\n\n<li><em>\u201cI want to make a jig like this, but can you make it?&#8221;<\/em><\/li>\n<\/ul>\n\n\n\n<p>Whether you have a clearly defined issue or just a feeling that something isn\u2019t working correctly, we\u2019re happy to listen and explore potential solutions together<\/p>\n\n\n\n<h3 class=\"wp-block-heading\"><strong>Visit Us at Booth 71<\/strong><\/h3>\n\n\n\n<p>If you\u2019re attending <strong>TestConX 2026<\/strong>, we invite you to stop by <strong>Booth 71<\/strong>.<br>We look forward to meeting you in person and discussing how we can help address your semiconductor testing challenges\u2014both now and in the future.<\/p>\n\n\n\n<p>Even if you can\u2019t make it to the event, we\u2019d still be happy to connect \u2014 please feel free to <a href=\"https:\/\/www.seiken.co.jp\/english\/contact_us\/\" title=\"\">contact us<\/a> with any questions or to discuss the event further.<\/p>\n\n\n\n<figure class=\"wp-block-image size-large is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"702\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/uploads\/2026\/01\/TestConX2026-english-1024x702.png\" alt=\"Join Us at TestConX\" class=\"wp-image-692\" style=\"aspect-ratio:1.459008790058959;width:748px;height:auto\" srcset=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/uploads\/2026\/01\/TestConX2026-english-1024x702.png 1024w, https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/uploads\/2026\/01\/TestConX2026-english-300x206.png 300w, https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/uploads\/2026\/01\/TestConX2026-english-768x526.png 768w, https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/uploads\/2026\/01\/TestConX2026-english-1536x1053.png 1536w, https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/uploads\/2026\/01\/TestConX2026-english-2048x1404.png 2048w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n","protected":false},"excerpt":{"rendered":"<p>Where the Forefront of Semiconductor Testing Comes Together TestConX 2026, one of the world\u2019s most respected c [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[1],"tags":[],"class_list":["post-691","post","type-post","status-publish","format-standard","hentry","category-uncategorized"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/posts\/691","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/comments?post=691"}],"version-history":[{"count":1,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/posts\/691\/revisions"}],"predecessor-version":[{"id":693,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/posts\/691\/revisions\/693"}],"wp:attachment":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/media?parent=691"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/categories?post=691"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/tags?post=691"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}