{"id":826,"date":"2026-06-30T17:30:00","date_gmt":"2026-06-30T08:30:00","guid":{"rendered":"https:\/\/www.seiken.co.jp\/english\/?p=826"},"modified":"2026-06-30T17:17:23","modified_gmt":"2026-06-30T08:17:23","slug":"emax-asia-2026-discover-seikens-test-solutions","status":"publish","type":"post","link":"https:\/\/www.seiken.co.jp\/english\/news\/1204\/","title":{"rendered":"EMAX Asia 2026 | Discover Seiken&#8217;s Test Solutions"},"content":{"rendered":"\n<h3 class=\"wp-block-heading has-text-align-center\">From Wafer Test to Final Test \u2014 We Cover Every Contact Point<\/h3>\n\n\n\n<p>Seiken is pleased to announce its first-ever participation in <strong>EMAX Asia 2026<\/strong>, one of Southeast Asia&#8217;s leading exhibitions for electronics manufacturing and semiconductor technologies. Visit us at Booth A196 from<strong> July 22\u201324, 2026<\/strong>, at the<strong> Setia SPICE Convention Centre in Penang, Malaysia<\/strong>, and discover how our advanced test contact solutions help improve reliability, accuracy, and efficiency throughout the semiconductor manufacturing process.<\/p>\n\n\n\n<p>As a Japanese manufacturer with decades of experience in precision contact technology, Seiken provides customized solutions for semiconductor testing, including <strong>contact probes (pogo pins), probe cards, IC test sockets, test fixtures, and high-performance testing systems<\/strong>. Our technologies support applications ranging from wafer probing and semiconductor packaging to PCB testing, functional testing, automotive electronics, power devices, and advanced electronic manufacturing.<\/p>\n\n\n\n<p>EMAX Asia brings together semiconductor manufacturers, EMS companies, OSAT providers, PCB manufacturers, and automation specialists from across Malaysia and Southeast Asia, making it an ideal opportunity to discuss your current testing challenges directly with our engineering and sales team. Whether you are looking for <strong>high-current probes, high-frequency test solutions, non-magnetic probes, Kelvin probes, custom test sockets, or complete testing fixtures<\/strong>, Seiken offers tailored solutions designed to meet your specific requirements.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Exhibition Details<\/h3>\n\n\n\n<figure class=\"wp-block-flexible-table-block-table\"><table class=\"has-fixed-layout\"><tbody><tr><th style=\"width:25%\"><strong>Event<\/strong><\/th><td>Electronics Manufacturing Expo Asia (EMAX) 2026<\/td><\/tr><tr><th style=\"width:25%\"><strong>Dates<\/strong><\/th><td>July 22 (Wed) &#8211; 24 (Fri), 2026<\/td><\/tr><tr><th style=\"width:25%\"><strong>Venue<\/strong><\/th><td>Setia SPICE Convention Centre, Penang, Malaysia<\/td><\/tr><tr><th style=\"width:25%\"><strong>Booth Number<\/strong><\/th><td><strong>A196<\/strong><\/td><\/tr><tr><th style=\"width:25%\"><strong>Official Website<\/strong><\/th><td><a href=\"https:\/\/emaxasia.com\/information.html\" title=\"\">EMAX Asia 2026<\/a><\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n<h4 class=\"wp-block-heading\">Custom Probe, Socket &amp; Fixture Solutions for Every Testing Challenge<\/h4>\n\n\n\n<p>If you are attending EMAX Asia 2026, we warmly invite you to visit <strong>Booth A196<\/strong> to explore our latest technologies, discuss your upcoming projects, and discover how Seiken can help optimize your semiconductor testing process with reliable, high-quality solutions. We look forward to meeting you in Penang and becoming your trusted partner for semiconductor test contact solutions.<\/p>\n\n\n\n<p class=\"has-text-align-center\"><strong>One Partner. Complete Testing Solutions.<\/strong><\/p>\n\n\n<div class=\"wp-block-image\">\n<figure class=\"aligncenter size-full\"><a href=\"https:\/\/www.seiken.co.jp\/english\/contact_us\/\"><img loading=\"lazy\" decoding=\"async\" width=\"778\" height=\"482\" src=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/uploads\/2026\/06\/emax-2026-photo1-.jpg\" alt=\"EMAX Asia 2026\" class=\"wp-image-827\" srcset=\"https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/uploads\/2026\/06\/emax-2026-photo1-.jpg 778w, https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/uploads\/2026\/06\/emax-2026-photo1--300x186.jpg 300w, https:\/\/www.seiken.co.jp\/english\/wp\/wp-content\/uploads\/2026\/06\/emax-2026-photo1--768x476.jpg 768w\" sizes=\"auto, (max-width: 778px) 100vw, 778px\" \/><\/a><\/figure>\n<\/div>\n\n\n<p><\/p>\n","protected":false},"excerpt":{"rendered":"<p>From Wafer Test to Final Test \u2014 We Cover Every Contact Point Seiken is pleased to announce its first-ever part [&hellip;]<\/p>\n","protected":false},"author":5,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[1],"tags":[],"class_list":["post-826","post","type-post","status-publish","format-standard","hentry","category-uncategorized"],"aioseo_notices":[],"acf":[],"_links":{"self":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/posts\/826","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/users\/5"}],"replies":[{"embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/comments?post=826"}],"version-history":[{"count":4,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/posts\/826\/revisions"}],"predecessor-version":[{"id":831,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/posts\/826\/revisions\/831"}],"wp:attachment":[{"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/media?parent=826"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/categories?post=826"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.seiken.co.jp\/english\/wp-json\/wp\/v2\/tags?post=826"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}