ProductsVertical vs. Cantilever Probe Cards:
Choosing the Right Solution for Your Testing Needs
What is a Probe Card?
A probe card is a key component in the semiconductor testing process, used to make electrical contact during inspection. Semiconductor testing can be broadly divided into front-end (wafer-level) testing and back-end (package) testing (e.g., BGA, CSP, QFN). Probe cards play a vital role in wafer testing during the front-end stage.
There are two main types of probe cards: advanced vertical type and cantilever type. At Seiken, we specialize in advanced vertical-type probe cards built with our proprietary contact probe technology, delivering superior performance and flexible solutions tailored to your unique testing requirements.
At Seiken, we exclusively offer advanced (vertical) probe cards based on contact probe technology.
Please note that cantilever-type probe cards are not part of our product lineup.
Why Choose Vertical-Type Probe Cards?
Vertical probe cards, also known as advanced probe cards, feature vertically aligned terminals (probes) mounted on modular blocks, allowing for high precision and easy customization.
- Flexible Layouts: Supports various configurations, ideal for grid patterns and multi-site testing.
- Optimized for Maintenance: Individual probes can be replaced easily, reducing downtime.
- Reduced Wafer Damage: Vertical contact minimizes probe marks, reducing damage to the wafer.
- Solder Bump Compatibility: Gentle contact prevents damage to fragile solder surfaces.
Understanding Cantilever-Type Probe Cards
Cantilever probe cards use needle-like tungsten probes—resembling the teeth of a rake—that extend directly from the board without housings.
- Lower Cost: The housing-free design offers a cost advantage over vertical-type probe cards.
- Fine Pitch Compatibility: Good for narrow electrode spacing.
- Strong Aluminum Contact: Reliable contact with aluminum electrodes.
Understanding the Pros and Cons of Vertical and Cantilever Probe Cards
| Characteristics | Vertical Type | Cantilever Type |
|---|---|---|
| Pin Layout | Highly flexible; perfect for complex multi-site testing |
Limited to peripheral layouts with angled contact |
| Maintenance | Easy, in-house pin replacement |
Requires precision adjustments; external repair often needed |
| Probe Marks | Minimal (vertical contact) |
Larger marks (sliding contact) |
| Aluminum Pads | Less suitable, but adaptable with Seiken’s technology |
Strong resistance to oxide layers enables stable contact |
| Cost | Higher initial investment |
More cost-effective to implement |
At Seiken, we don’t just deliver products—we solve problems. Our vertical-type probe cards offer the reliability and customization needed to meet your challenges head-on.
Have questions or specific testing needs? Let’s talk. We’re here to find the right probe card solution for your application.