Customer Challenges / Request
As demand grows for magnetic sensor components—like electronic compasses, Hall ICs, and MR/MI sensors used in smartphones, computers, and automotive electronics—manufacturers face a critical challenge:
How to perform precise, high-throughput electrical testing without being affected by magnetic interference.
Standard test equipment, which often contains magnetic materials, can distort measurements and affect sensor accuracy.
Our Solution
Seiken developed a non-magnetic probe card, specifically designed to support accurate testing of magnetic sensor components:
- Used vertical probe pins made from proprietary non-magnetic materials to eliminate external magnetic interference.
- Designed custom pin shapes to maintain strong, stable contact with delicate terminals.
- Created a flexible terminal layout to support more simultaneous measurement points, increasing test efficiency.
Results & Benefits
- Reliable Testing in Magnetic Environments: Ensures test results are not affected by magnetic fields.
- Increased Throughput: Greater number of simultaneous measurements per test cycle.
- Fine-Pitch Compatibility: Precision probe design supports high-density terminal layouts.
- Improved Maintainability: Probe pins can be replaced by the user, reducing downtime.
- Full Structural Integrity: Non-magnetic materials, including the PCB, used throughout for maximum test stability.
Application
This solution is ideal for front-end and back-end inspection of magnetic-sensitive semiconductor components, including:
- Electronic compasses.
- Hall effect ICs.
- MR (Magneto-Resistive) and MI (Magneto-Impedance) sensors.
It supports manufacturers aiming to scale production without sacrificing measurement accuracy, especially for next-generation mobile and automotive applications.