ProductsResistance Stabilization Technology
Revolutionizing Your Test Solutions
At Seiken, we support stable resistance measurements through our advanced bias probe technology. By integrating a conductive bias ball inside a vertical (pogo-type) probe, uniform contact pressure is applied between the plunger and the inner wall of the barrel. This design significantly reduces contact wear and resistance variation—ensuring highly accurate and consistent electrical measurements, even during long-duration burn-in or high-reliability testing.
Traditional designs faced challenges such as internal damage or scratching due to excessive pressure on the probe barrel, and were not well-suited for fine-pitch applications due to bias ball size limitations. Seiken has developed a breakthrough solution that overcomes these issues.
Key Features & Advantages
01 Stable contact performance
With over 100,000 test cycles of proven performance, Seiken’s bias probes deliver consistent contact and minimized resistance variation, even under current load. This stability makes them ideal for demanding testing environments that require precision and durability.
02 Optimized for size reduction
As electronic components continue to shrink, Seiken now offers bias probe structures that support pitch sizes as small as 0.4mm. This enables highly accurate low-resistance measurements while minimizing the natural resistance variation inherent in traditional contact probes.
03 Enhanced durability
Our precision manufacturing ensures ideal contact performance while evenly distributing pressure within the probe barrel. This reduces the risk of damage or scratching (galling) over repeated use—greatly improving durability and test consistency over time.
Application Examples
Explore more
- Crystal devices
- High-current devices
- Any test requiring enhanced probe resistance stability