ProductsHigh-Frequency Technology
Precision Testing Solutions with Low Inductance
In high-frequency testing, minimizing inductance is the key to achieving accurate and reliable measurements. The shorter the probe, the lower the inductance. To meet these strict requirements, we have developed a compact double-ended probe with a total length of just 1.2mm—made possible through advanced microfabrication and assembly techniques. Despite its extremely small size, this probe maintains the same structure and usability as standard double-ended probes.
And with support for fine-pitch spacing down to 0.3mm, it’s an ideal solution for inspecting today’s ever-smaller electronic components.
Key Features & Advantages
01 Low inductance for high-frequency accuracy
By utilizing precision-cut miniature components and assembling them into a compact 1.2mm form factor, we’ve achieved excellent low-inductance characteristics—essential for high-frequency test environments.
02 Reliable contact with customizable tip shapes and alloys
Choose from a variety of tip shapes—including needle, crown, and rounded types—tailored to suit your specific test targets. We also offer contact alloys specially selected for optimal performance with soldered surfaces, ensuring stable and repeatable electrical connections.
Application Examples
Explore more
- High-Frequency Device Testing