ProductsAdvanced Probe Cards
What is an advanced probe card?
Probe cards are critical components in wafer testing—an essential step in the front-end process of semiconductor manufacturing. At Seiken, we provide cutting-edge vertical probe cards engineered for adaptability in modern testing environments. Our vertical design features vertically aligned probes mounted on a substrate, enabling greater flexibility in pin arrangement and compatibility with matrix-style terminal layouts. This design minimizes probe marks compared to traditional cantilever-type probe cards. In addition, these cards support not only aluminum electrodes but also newer electrode types such as solder bumps and copper pillars. Each probe is individually replaceable, making maintenance simple and cost-effective. Combined with customizable pin configurations and multi-site testing capabilities, our probe cards are built to maximize efficiency and precision in every inspection.
Explore Our Products
At Seiken, we combine cutting-edge technology with deep expertise to design, manufacture, and assemble custom probe cards suited to your specific devices and test environments. Whatever your inspection requirements, we deliver tailored solutions for every application.
