ProductsVertical vs. Cantilever Probe Cards:
Choosing the Right Solution for Your Testing Needs
What is a Probe Card?
A probe card is a key component in the semiconductor testing process, used to make electrical contact during inspection. Semiconductor testing can be broadly divided into front-end (wafer-level) testing and back-end (package) testing (e.g., BGA, CSP, QFN). Probe cards play a vital role in wafer testing during the front-end stage.
There are two main types of probe cards: advanced vertical type and cantilever type. At Seiken, we specialize in advanced vertical-type probe cards built with our proprietary contact probe technology, delivering superior performance and flexible solutions tailored to your unique testing requirements.
Why Choose Vertical-Type Probe Cards?
Vertical probe cards, also known as advanced probe cards, feature vertically aligned terminals (probes) mounted on modular blocks, allowing for high precision and easy customization.
- Flexible Layouts: Supports various configurations, ideal for grid patterns and multi-site testing.
- Optimized for Maintenance: Individual probes can be replaced easily, reducing downtime.
- Reduced Wafer Damage: Vertical contact minimizes probe marks, reducing damage to the wafer.
- Solder Bump Compatibility: Gentle contact prevents damage to fragile solder surfaces.
Understanding Cantilever-Type Probe Cards
Cantilever probe cards use needle-like tungsten probes—resembling the teeth of a rake—that extend directly from the board without housings.
- Lower Cost: The housing-free design offers a cost advantage over vertical-type probe cards.
- Fine Pitch Compatibility: Good for narrow electrode spacing.
- Strong Aluminum Contact: Reliable contact with aluminum electrodes.
Understanding the Pros and Cons of Vertical and Cantilever Probe Cards
| Characteristics | Vertical Type | Cantilever Type |
|---|---|---|
| Pin Layout | Highly flexible; perfect for complex multi-site testing |
Limited to peripheral layouts with angled contact |
| Maintenance | Easy, in-house pin replacement |
Requires precision adjustments; external repair often needed |
| Probe Marks | Minimal (vertical contact) |
Larger marks (sliding contact) |
| Aluminum Pads | Less suitable, but adaptable with Seiken’s technology |
Strong resistance to oxide layers enables stable contact |
| Cost | Higher initial investment |
More cost-effective to implement |
At Seiken, we don’t just deliver products—we solve problems. Our vertical-type probe cards offer the reliability and customization needed to meet your challenges head-on.
Have questions or specific testing needs? Let’s talk. We’re here to find the right probe card solution for your application.