ProductsHigh-Current Probe Card
Pushing the Limits of High-Current Testing
As automotive technologies such as IGBTs advance, the need for high-current testing—handling several hundred amps through emitter electrodes—is growing rapidly. Traditional probe cards often struggle under these extreme conditions, even when load distribution is optimized across multiple pins.
Seiken’s high-current probe card overcomes these barriers by incorporating CNT (Carbon Nanotube) technology at the probe tips, dramatically increasing the allowable current capacity. In addition, the card’s main bodis built with a robust metal structure that allows current to flow through the housing as well, minimizing the load on each individual pin. This innovative design enables far more stable and reliable high-current measurements. If you are facing challenges in high-current testing, we invite you to consult with us.
Key Features & Advantages
01 High-current capability
Our probes are reinforced with CNT technology and a metal housing structure, greatly enhancing current endurance. Compared to traditional wire probes, the shorter terminal length delivers lower inductance, contributing to higher performance.
02 Superior AC characteristics
By reducing the probe card height to less than half the conventional 30mm, we achieve significantly enhanced AC performance and improved measurement stability.
03 Fully customizable solutions
Every probe card is custom-designed to integrate with your chip handlers and testers. Flexible manufacturing is available starting from a single unit to full-scale production.
Application Examples
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- Power Devices (IGBTs, SiC, GaN devices)
- Power Semiconductors (High-Voltage MOSFETs, Diodes)