ProductsNon-Magnetic Probe Card

Enabling High-Precision Testing in Non-Magnetic Environments

Seiken’s non-magnetic probe cards are engineered from the ground up, backed by years of experience, very detail—from material selection and precision machining to surface treatment, PCB manufacturing, and assembly—is carefully managed within a fully integrated process. The result is a probe card that delivers consistently stable, high-precision inspections even in the most magnetically sensitive environments.
An optional socket kit further expands functionality, making these probe cards ideal for manual testing of packaged devices.
Ideal for testing components sensitive to magnetic fields—such as electronic compassesーour non-magnetic probe cards provide reliable solutions where uncompromised measurement accuracy is essential.

Non-Magnetic, Including PCB
Non-Magnetic Probe Head:​
Supports 200μm Pitch​

Key Features & Advantages

01 Flexible probe pin array

With Seiken’s advanced design capabilities, probe arrays can be flexibly configured to match the specific requirements of your device, ensuring optimal performance and precision.

02 Fine-pitch capability — Precision testing at 150µm pitch

Supports ultra-fine pitches down to 150µm, making it ideal for the high-precision testing of miniaturized electronic components.

03 Complete one-stop solution

From design through manufacturing and assembly, Seiken provides fully integrated production, delivering the optimal non-magnetic probe card tailored to your testing environment.

04 Small lot production available

Custom probe cards are available starting from a single unit, offering flexible support for prototypes, development projects, and specialized applications.

05 Socket kit option for manual testing

Enhance flexibility by adding an optional socket kit, allowing the same non-magnetic environment to be used for efficient manual testing of packaged devices.

  • Precision inspection of electronic compasses
  • Characterization of Hall ICs
  • Magnetic field influence testing for MR and MI sensors
  • High-precision testing in environments sensitive to magnetic fields
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