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Advanced probe cards & socket kits

We offer probe cards which use our vertical contact probes in WL-CSP testing. Advanced types have no limits in pin assignment and this allows for testing several chips at same time and products with large number of pins when conducting wafer test.

Advanced probe cards & socket kits

We apply our know-how as an IC socket and probe card manufacturer to meet the diversified need of our customers. For more information, please contact at info@seiken.co.jp

Advanced probe cards & socket kits

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Head Office

10F, Techno-Port Mitsui Seimei Building, 2-16-2 Minamikamata Ota-ku, Tokyo, Japan, 144-0035 (MAP)

TEL 81-3-3734-1212Telephone reception service:
9:00-18:30(weekday)

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