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Kelvin probe card & socket kits

Our Kelvin contact probe cards are suitable for area-array layout kelvin contacting to keep stable contact to micro bump and pad.

Kelvin probe card & socket kits

We provide two types of vertical contact Kelvin probe. One is a super-fine probe for Kelvin measurement to test WL-CSP with a pitch 0.3mm and the other is a new type of Kelvin probe for a pitch 0.4mm.

Kelvin probe card & socket kits

The super-fine pitch kelvin probe places importance on contact with a narrow pitch and the new type kelvin probe involves a design for the pin filling in the gap between 2 pins with our unique technologies. For more information, please contact at info@seiken.co.jp

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10F, Techno-Port Mitsui Seimei Building, 2-16-2 Minamikamata Ota-ku, Tokyo, Japan, 144-0035 (MAP)

TEL 81-3-3734-1212Telephone reception service:
9:00-18:30(weekday)

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