SEIKEN has been developing the following technologies.
We provide standard type contact probes to be used for testing printed circuit boards and electronic components. Our standard types are basically single ended probes and also be mounted into receptacles (housing unit) where an electrical connection is made.Standard type contact probes
Double plunger contact probes are typically used for semiconductor testing and we offer various types to meet high level requirements.Double plunger Contact Probes
Carbon nanotube(CNT) is allotropes of carbon with a cylindrical structure and the size is about φ0.1μm x 20μm. We have developed our own CNT coating technologies and we will apply the technology to contact probes for power device testing in the future.CNT(Carbon Nano Tube) Technology
We have developed highly non-magnetic contact probes to realize higher customs needs by improving processing technology and usage of new non-magnetic materials and surface treatment.Non-magnetic technology
Rare metals (minor metals) are known for having superior properties. We have developed new contact probe with its tip material made of rare metals by using our unique technologiesRare metal(minor metal) joining technology
We provide support for Kelvin measurement to contact 2 points on one electrode by utilizing our own know-how and technologies. We make approached though our unique tip shape and processing in addition to ensuring space by simply tapering pins.Kelvin technology
Recent growth of electrical devices and high density, fine pith contact probes are required. We are always challenging and developing fine pith contact probes by utilizing our processing technologies and skill.Fine pitch technology
Bias ball forces plunger into continuous contact with the barrel inner wall at all times and this has disadvantage such as decreased lifespan and pitch. We have developed new bias design technology.Bias technology
For lead-free bumps and solder balls, due to adherence of solder, the life of traditional probes is shortened and running cost is increased. Our product development is based on the lead-free solution to meet customer’s needs.Lead-free technology
To ensure products reliability, thermal resistance test under high temperature is very essential. We will propose our best solution under high temperature.High heat resistance technology
Spring Contact Probes (also referred as Pogo Pins, Test Pins, Spring Pins etc.) are used to make contact to various test points on various electronic components for continuity test. Spring contact probes are usually made up of a tubular barrel, a spring and a plunger.
The traditional use for contact probes is to make contact with printed circuit boards (PCB) or electrical components in order to test functionally and to measure the value of the components.
They are used for Wafer test (WL-CSP, Flip Chip) in the front-end process and semiconductor package test (BGA, CSP, QFN, SON) in the back-end process. Moreover, they can be also used for FPD lighting inspection test, printed circuit board continuity test, battery charge-discharge test and other various components test.
A contact probe is the core competence of SEIKEN and based on test probe pin manufacture technology, we can provide various types of contact probes to meet customer’s requirements.
Pad electrode for inspection is getting smaller and higher precision technology is required. For fine pitch contact probes, precision control by μm is necessary.
A contact probe will encounter multiple environmental or physical conditions that will affect probe life.
Higher electrical current passes through a contact probe at working stroke for the power device test application and high electrical current load gives much damage to a spring contact probe.
The spring force of a contact probe will be reduced by heat under high temperature environment and therefore it is difficult to secure contact reliability and measurement accuracy.
We offer a wide variety of contact probes and receptacles on pitches ranging from 0.45mm to 2.54mm. Plunger tip styles can be provided in a variety of tip styles for our standard type contact probes. Receptacles are available with preassembled cable length 100mm or 300mm as option.Should you have any question or need more information, please contact at email@example.com.
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