Contact Probes

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Contact Probes

SEIKEN has been developing the following technologies.

What is a contact probe?

Spring Contact Probes (also referred as Pogo Pins, Test Pins, Spring Pins etc.) are used to make contact to various test points on various electronic components for continuity test. Spring contact probes are usually made up of a tubular barrel, a spring and a plunger.

What is a contact probe?

The traditional use for contact probes is to make contact with printed circuit boards (PCB) or electrical components in order to test functionally and to measure the value of the components.

They are used for Wafer test (WL-CSP, Flip Chip) in the front-end process and semiconductor package test (BGA, CSP, QFN, SON) in the back-end process. Moreover, they can be also used for FPD lighting inspection test, printed circuit board continuity test, battery charge-discharge test and other various components test.

A contact probe is the core competence of SEIKEN and based on test probe pin manufacture technology, we can provide various types of contact probes to meet customer’s requirements.

Probing challenges

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We offer a wide variety of contact probes and receptacles on pitches ranging from 0.45mm to 2.54mm. Plunger tip styles can be provided in a variety of tip styles for our standard type contact probes. Receptacles are available with preassembled cable length 100mm or 300mm as option.Should you have any question or need more information, please contact at info@seiken.co.jp.

Please click on your desired catalog for the following.

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10F, Techno-Port Mitsui Seimei Building, 2-16-2 Minamikamata Ota-ku, Tokyo, Japan, 144-0035 (MAP)

TEL 81-3-3734-1212Telephone reception service:
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