High current probe card is a vertical probe card that permits the application of high electric current to emitter electrode of a semiconductor chip such as IGBT for automobile application.
Our high current probe card is a probe card for chip-level pre-bond testing. It is a large current distribution type probe card which was significantly up the allowable current in a new approach for large current measurement of the semiconductor chips. In addition, it is excellent in AC characteristics and also achieved low inductance as well as electric current.
Free layout of probing by using our vertical pogo pins and it is possible to make a large number of pins on full matrix compared to cantilever. For more information, please contact at info@seiken.co.jp
